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Showing results: 9571 - 9585 of 17057 items found.

  • Computerized Automatic Relay Tester

    CVRT-S16 - Vasavi Electronics

    CVRT-S8 & S16 are ideal for automatic testing of ELECTRO MECHANICAL AND READ RELAYS (only DC relays) both for static and dynamic characteristics. This system scans at one stroke, all the parameters of the relay as per definition of test procedure. The test sequence can be pre-programmed and stored in the disk. You can select the tests as per your requirement. Can include or exclude the test and you can have several options to match your test definitions. Semi skilled person can be engaged for actual testing, as he need not make any settings and need not interpret the readings. The system conducts the tests and gives PASS / FAIL indication on overall test results. If a printer is connected, each test result will be printed.

  • LED Drivers And Backlighting

    Microchip Technology Inc.

    Simplify the development of LED applications and get to market faster with our complete portfolio of LED drivers, which can be combined with our microcontrollers and power management, interface and connectivity products. These solutions help you integrate LED technologies into complex and high-reliability applications such as automotive safety systems. We can also simplify the design of other emerging applications such as Human Centric Lighting (HCL) where LED technologies work together as a system to mimic the cycle of natural lighting which can improve health and productivity. We offer development tools and other design resources, along with specialized technical support to help you create exciting and innovative LED applications.

  • Boundary-Scan Interactive Analyzer & Toolkit

    ScanExpress JTAG Debugger - Corelis, Inc.

    Test probe access is a luxury—modern electronic system design techniques such as blind and buried vias or ball-grid-array (BGA) devices guarantee limited signal access. Test points quickly reduce precious board real-estate and can even degrade performance. ScanExpress JTAG Debugger overcomes these limitations to provide the control and visibility necessary to quickly debug and test hardware, using a simple JTAG port to interface with IEEE-1149.1 compliant devices.Whether debugging prototype hardware, enhancing production tests with boundary-scan control, or diagnosing a faulty board in the field, ScanExpress Debugger’s easy-to-use and versatile interface helps engineers test and debug systems faster and more efficiently.

  • 3 Phase Reference Standard

    ZERA® COM5003 - Powermetrix Systems

    The COM5003 Reference Standard is part of the ZERA/Powermetrix high precision measuring instrument series. With the highest accuracy of 0.005 % (50 ppm), the COM5003 presents its new innovative digital technology and extended features for measurement. As a primary standard, the COM5003 is designed for testing current and voltage meters as well as single- or three-phase power and energy meter testing systems. This precise technology is especially useful in metrological institutes, official utility lab applications, and other environments for energy suppliers or manufacturers of electric meters and designed for integration of existing systems. All operation, measurements and data visualizations can be viewed using by the COM5003’s simple user interface and 9“ touchscreen.

  • Isolated Process Control Signal Conditioning Products

    SCIM7B - Bee Instruments

    SCIM7B Isolated Process Control Signal Conditioning Modules provide a complete selection of backpanels DIN rail mounting accessories, interface cables and rack mounting hardware.Each SCIM7B module provides a single of isolated analog input or output. Various input modules accept analog voltage or current signals from all types of field sensors and sources, filter, isolateamplify, linearize and convert these input signals to high-level analog outputs suitable for use in a process control system. Output modules accept high-level analog voltage signals from a process control system, then buffer, isolate, filter, convert and amplify before providing a current or voltage output to a fielddevice.

  • Enerchron® 2.0 Test Management Software

    NH Research, Inc.

    Enerchron 2.0 test management software is a software suite ideally suited for test applications that yield extensive data over an extended period of time such as battery cycling and evaluation. It allows the creation of complex, dynamic test sequences without requiring the skills of a programmer. In addition to real-time viewing during execution, measurements are automatically archived for review and analysis after testing has been completed. Enerchron is available with NH Research’s Regenerative Battery Test System (Model 9200) or can be used to control additional Battery Test Systems, NHR air-cooled electronic loads, power supplies, temperature chambers, and data acquisition devices that measure temperature and pressure.

  • Bench hardness testers

    NovoTest

    Digital Brinell Hardness Tester NOVOTEST TB-B-C has 10 steps testing force settings, allows user to measure hardness values with each of 10 Brinell hardness scales. The device uses the round type of indenter along with the control system. It is highly accurate, gives repeatable results, reliable and easy to operate.Digital Brinell Hardness Tester NOVOTEST TB-B-C has fully automatically test cycle: loading, dwell and unloading. As a result, the operator errors don’t influence on measuring results.Motorized indenter and electronic control system allow making measurements with high accuracy. Absence of mechanical weighs reduce problems of friction and vibration sensitivity of the machine.

  • Wafer ESD Tester lineup

    Hanwa Electronic Ind. Co.,Ltd.

    ◆Correspond to 300mm Wafer. This tester can measure LED or the large sizes Wafer, such as a system LSI. And Zap of HBM/MM can be performed. The Automatic destructive judging by V/I measurement can also be performed after Zap.◆Waveform guarantee in Zap needles. HED-W5100D carries out the calibration before shipment in the place of Zap needles. Therefore, Correlation of the Result of a Package Device becomes clear easily.◆Correspondence to Standards This Tester corresponds to the Standard of JEITA, ESDA, and JEDEC. A Zap unit adopts the plug-in system and also has the waveform of Customer's requests.◆Connection with TLP This Tester is the best for TLP Testing with deep relation of ESD. The protection circuit of a device with an ESD problem is investigated.

  • RH Calibrator / Dew Point Generator

    Edgetech Instruments

    Edgetech Instruments'' portable calibration system offers the highest accuracy available for both relative humidity and temperature. Using chill mirror technology and precision PRT's, Edgetech''s calibrators offer best repeatability, stability and reliability when measuring RH and temperature. The calibrators are used mainly by calibration labs as a reference standard.The Edgetech Instruments dew point generator, DewGen, another calibration lab favorite, can be used as a stand alone or with a NIST traceable chill mirror dew point system creating very accurate dew points or frost points. Depending on the dry gas source this generator can create dew points from +15C to -80C.

  • JTAG Functional Test

    JFT - JTAG Technologies Inc.

    JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)

  • SWB-2811, 8x21, 1 A, Reed Relay Matrix Module for SwitchBlock

    781420-11 - NI

    8x21, 1 A, Reed Matrix Module for SwitchBlock - The SWB‑2811 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.

  • SWB-2811, 8x21, 1 A, Reed Relay Matrix Module for SwitchBlock

    781421-11 - NI

    8x21, 1 A, Reed Matrix Module for SwitchBlock - The SWB‑2811 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.

  • SWB-2816, 8x46, 0.3 A, Row Access, Reed Relay Matrix Module for SwitchBlock

    781420-16 - NI

    8x46, 0.3 A, Reed Matrix Module for SwitchBlock - The SWB‑2816 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, … individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.

  • SWB-2814, 8x9, 1 A, 2-Wire Reed Matrix Module for SwitchBlock

    781420-14 - NI

    8x9, 1 A, 2-Wire Reed Matrix Module for SwitchBlock - The SWB‑2814 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.

  • SWB-2814, 8x9, 1 A, 2-Wire Reed Matrix Module for SwitchBlock

    781421-14 - NI

    8x9, 1 A, 2-Wire Reed Matrix Module for SwitchBlock - The SWB‑2814 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.

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